Study on Determination of optical absorption coefficient of sample with rough surface ii. experimental results on silicon wafer 表面粗糙样品吸收系数的测量研究Ⅱ.硅片的实验结果
Alignment Stage for Mask-Sample Wafer 掩模一样片对准台
The optical and electrical properties of ZnO/ porous Si ( PS) heterostructure are studied. The PS sample is formed by the anodization of a single-crystal Si wafer. ZnO films are then deposited on the PS substrate by pulsed laser deposition. 用脉冲激光沉积的方法在多孔硅(PS)衬底上沉积ZnO薄膜,在室温下测量了ZnO/PS异质结的结构及光学和电学性质。